CMP Polishing Pads

Three pad structures form an independent line for rough, fine and surface polishing of wafers, substrates and optical materials.

SiCCMPSample → Batch
PRODUCT LINE 02 · CMP

CMP polishing pads

Polyurethane, nonwoven and suede-type nonwoven pads selected by workpiece, polishing stage, equipment and target metrics.

CMP
Polyurethane polishing pads

Polyurethane polishing pads

Foamed cured polyurethane with a closed-cell structure; wear resistant, efficient and dimensionally stable for rough polishing.

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Nonwoven polishing pads

Nonwoven polishing pads

Permeable polymer-fibre structure with configurable microstructure for fine polishing processes.

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Suede-type nonwoven polishing pads

Suede-type nonwoven polishing pads

Lower hardness, higher compression and good elasticity to improve roughness and within-wafer uniformity.

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Rough polishingFine polishingGroove patternHardness & compressionEquipment fitSample validation
Polishing tests and equipment fit
PROCESS VALIDATION

Polishing tests and equipment fit

Review platen size, operating conditions, polishing stage and surface targets; validate with samples when required.

Rough polishingFine polishingGroove patternHardness & compressionEquipment fitSample validation
PRODUCTION & LAB

Production and laboratory facilities

Our wet-laid nonwoven production line, surface-finishing equipment, polishing laboratory and inspection laboratory support material preparation, processing and performance validation.

  • Polyurethane pad production
  • Nonwoven polishing pad production
  • R&D and inspection labs
  • Polishing equipment and validation
Production and laboratory facilities

Need a pad matched to your process?

Send the workpiece, equipment, polishing stage and target results for a technical recommendation.

Submit process parameters
Request a quote